Theme 3: Benchmark and Metrics

As spintronics advances, one key aspect will be to benchmark device and circuit performance to more traditional systems based on CMOS. How will this be done?

WIN will lead the research effort in answering this challenge by addressing both the fundamental limits of spintronics and devices while also looking at circuit level performance metrics. Other issues such as fan out, function, energy, speed, tolerance, reproducibility and manufacturability will be investigated and addressed. The theme lead is Vwani Roychowdhury from UCLA.